Optical security and counterfeit deterrence techniques IV : 23-25 January 2000, San Jose, USA /

Bibliographic Details
Corporate Authors:	IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors:	Van Renesse, Rudolf L.
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2002]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4677.
Subjects:	Optoelectronic devices > Congresses. Security systems > Congresses. Counterfeits and counterfeiting > Congresses. Holography > Congresses.

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