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Nanostructure science, metrology, and technology : 5-7 September 2001, Gaithersburg, USA /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, National Institute of Standards and Technology (U.S.), United States. Office of Naval Research
Other Authors: Peckerar, Martin Charles, 1946-, Postek, Michael T.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2002]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4608.
Subjects:
Nanotechnology > Congresses.
Nanostructures > Congresses.
Metrology > Congresses.
Microelectronics > Congresses.

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Call Number: T174.7 .N365 2002
 
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T174.7 .N365 2002 Available