Cover Image

Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2002 : San Jose, CA USA, March 12-14, 2002 /

Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium San Jose, California, IEEE Components, Hybrids, and Manufacturing Technology Society
Format: Conference Proceeding Book
Language:English
Published: Piscataway, New Jersey : IEEE, [2002]
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.
Description
Item Description:Cover title.
"IEEE catalog number 02CH37311"--Title page verso.
Physical Description:xii, 196 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0780373278 (softbound edition)
0780373286 (CD-ROM edition)