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Eighteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2002 : San Jose, CA USA, March 12-14, 2002 /

Bibliographic Details
Corporate Authors: IEEE Semiconductor Thermal Measurement and Management Symposium San Jose, California, IEEE Components, Hybrids, and Manufacturing Technology Society
Format: Conference Proceeding Book
Language:English
Published: Piscataway, New Jersey : IEEE, [2002]
Subjects:
Semiconductors > Thermal properties > Congresses.
Semiconductors > Cooling > Congresses.

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Call Number: TK7871.85 .I27 2002
 
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TK7871.85 .I27 2002 Available