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Test and measurement applications of optoelectronic devices : 21-22 January 2002, San Jose, USA /

Bibliographic Details
Other Authors: Chin, Aland K.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2002]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4648.
Subjects:
Optoelectronic devices > Testing > Congresses.
Optoelectronic devices > Reliability > Congresses.

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Holdings details from Remote Storage
Call Number: TK8300 .T46 2002
 
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TK8300 .T46 2002 Available