IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.

Bibliographic Details
Corporate Authors: Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society, IEEE Reliability Society
Format: Journal
Language:English
Published: New York, NY : Institute of Electrical and Electronics Engineers, [2001-]
Subjects:
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Description
Published:Vol. 1, no. 1 (Mar. 2001)-
Item Description:Title from cover.
Physical Description:volumes : illustrations ; 28 cm.
Also available to subscribers via the World Wide Web.
Publication Frequency:Quarterly
ISSN:1530-4388