IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.
| Corporate Authors: | , , |
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| Format: | Journal |
| Language: | English |
| Published: |
New York, NY :
Institute of Electrical and Electronics Engineers,
[2001-]
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| Subjects: | |
| Online Availability: |
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Remote Storage
| Call Number: |
TK7870.23 .I34 |
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| Notes: |
Subscription converted to electronic format. |
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| Library Owns: TK7870.23 .I34 | (v.1-3 (2001-2003)) | |
| Call Number | Status | Get It |
| TK7870.23 .I34 v.1 2001 | Available | |
| TK7870.23 .I34 v.2:no.1-3 2002:Mar.-Sept. | Available | |
| TK7870.23 .I34 v.2:no.4 2002:Dec. | Available | |
| TK7870.23 .I34 v.3 2003 | Available | |