IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society.

Bibliographic Details
Corporate Authors: Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society, IEEE Reliability Society
Format: Journal
Language:English
Published: New York, NY : Institute of Electrical and Electronics Engineers, [2001-]
Subjects:
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Remote Storage

Holdings details from Remote Storage
Call Number: TK7870.23 .I34
Notes: Subscription converted to electronic format.
Library Owns: TK7870.23 .I34 (v.1-3 (2001-2003))
Call Number Status Get It
TK7870.23 .I34 v.1 2001 Available
TK7870.23 .I34 v.2:no.1-3 2002:Mar.-Sept. Available
TK7870.23 .I34 v.2:no.4 2002:Dec. Available
TK7870.23 .I34 v.3 2003 Available