Fault-tolerance and reliability techniques for high-density random-access memories /

Bibliographic Details
Main Author:	Chakraborty, Kanad
Other Authors:	Mazumder, Pinaki
Format:	Book
Language:	English
Published:	Upper Saddle River, NJ : Prentice Hall, 2002.
Subjects:	Random access memory > Reliability. Integrated circuits > Fault tolerance. Semiconeductor storage devices.

Description
Physical Description:	xix, 426 pages : illustrations ; 24 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	0130084654