Cover Image

Fault-tolerance and reliability techniques for high-density random-access memories /

Bibliographic Details
Main Author: Chakraborty, Kanad
Other Authors: Mazumder, Pinaki
Format: Book
Language:English
Published: Upper Saddle River, NJ : Prentice Hall, 2002.
Subjects:
Random access memory > Reliability.
Integrated circuits > Fault tolerance.
Semiconeductor storage devices.

Remote Storage

Holdings details from Remote Storage
Call Number: TK7895.M4 C425 2002
 
Call Number Status Get It
TK7895.M4 C425 2002 Available