Machine vision applications in industrial inspection X : 21-22 January 2002, San Jose, USA /

Bibliographic Details
Corporate Authors:	IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors:	Hunt, Martin A. (Martin Anthony), 1963-
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2002]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4664.
Subjects:	Engineering inspection > Automation > Congresses. Computer vision > Industrial applications > Congresses. Quality control > Optical methods > Automation > Congresses. Measurement > Congresses.

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