Cover Image

Machine vision and three-dimensional imaging systems for inspection and metrology II : 29-30 October 2001, Newton, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Harding, Kevin G., Miller, John W. V.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2002]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4567.
Subjects:
Computer vision > Congresses.
Computer vision > Industrial applications > Congresses.
Three-dimensional display systems > Congresses.
Quality control > Optical methods > Congresses.
Metrology > Congresses.
Description
Physical Description:ix, 236 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:081944295X