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Machine vision and three-dimensional imaging systems for inspection and metrology II : 29-30 October 2001, Newton, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Harding, Kevin G., Miller, John W. V.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2002]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4567.
Subjects:
Computer vision > Congresses.
Computer vision > Industrial applications > Congresses.
Three-dimensional display systems > Congresses.
Quality control > Optical methods > Congresses.
Metrology > Congresses.

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Call Number: TA1634 .M32 2001
 
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TA1634 .M32 2001 Available