English, R. D. (2001). Substrate-enhanced time-of-flight secondary ion mass spectrometry. [publisher not identified].
Chicago Style (17th ed.) CitationEnglish, Robert Dale. Substrate-enhanced Time-of-flight Secondary Ion Mass Spectrometry. [Place of publication not identified]: [publisher not identified], 2001.
MLA (9th ed.) CitationEnglish, Robert Dale. Substrate-enhanced Time-of-flight Secondary Ion Mass Spectrometry. [publisher not identified], 2001.
Warning: These citations may not always be 100% accurate.