Substrate-enhanced time-of-flight secondary ion mass spectrometry /

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) can provide chemical information about the uppermost monolayers of a surface. In SIMS, keV projectiles bombard a sample, in turn supplying surface composition. An obstacle to using SIMS for routine characterization, however, has been low mol...

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Bibliographic Details

Main Author:	English, Robert Dale, 1973-
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 2001.
Subjects:	Major chemistry.
Online Access:	http://proxy.library.tamu.edu/login?url=http://proquest.umi.com/pqdweb?did=728908151&sid=1&Fmt=2&clientId=2945&RQT=309&VName=PQD