APA (7th ed.) Citation

International Symposium for Testing and Failure Analysis, Microelectronics Symposium, & Advanced Materials Symposium. Proceedings. ASM International.

Chicago Style (17th ed.) Citation

International Symposium for Testing and Failure Analysis, Microelectronics Symposium, and Advanced Materials Symposium. Proceedings. Metals Park, Ohio: ASM International.

MLA (9th ed.) Citation

International Symposium for Testing and Failure Analysis, et al. Proceedings. ASM International.

Warning: These citations may not always be 100% accurate.