Cover Image

Influences of interface and dislocation behavior on microstructure evolution : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A. /

Bibliographic Details
Other Authors: Aindow, Mark
Format: Book
Language:English
Published: Warrendale, Pa. : Materials Research Society, [2001]
Series:Materials Research Society symposia proceedings ; v. 652.
Subjects:
Metallography > Congresses.
Microstructure > Congresses.
Grain boundaries > Congresses.
Description
Physical Description:1 volume (various pagings) : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:1558995625