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Influences of interface and dislocation behavior on microstructure evolution : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A. /

Bibliographic Details
Other Authors: Aindow, Mark
Format: Book
Language:English
Published: Warrendale, Pa. : Materials Research Society, [2001]
Series:Materials Research Society symposia proceedings ; v. 652.
Subjects:
Metallography > Congresses.
Microstructure > Congresses.
Grain boundaries > Congresses.

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Call Number: TN689.2 .I48 2001
 
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TN689.2 .I48 2001 Available