Charged particle detection, diagnostics, and imaging : 30 July-2 August 2001, San Diego, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Delage, Olivier, Munro, Eric, Rouse, John A.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2001]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4510.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4510.toc
Description
Physical Description:ix, 236 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819442240