Charged particle detection, diagnostics, and imaging : 30 July-2 August 2001, San Diego, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Delage, Olivier, Munro, Eric, Rouse, John A.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2001]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4510.
Subjects:
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4510.toc

Internet

https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4510.toc

Remote Storage

Holdings details from Remote Storage
Call Number: QC791.775.P44 C43 2001
 
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QC791.775.P44 C43 2001 Available