Charged particle detection, diagnostics, and imaging : 30 July-2 August 2001, San Diego, USA /
| Corporate Author: | |
|---|---|
| Other Authors: | , , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[2001]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 4510. |
| Subjects: | |
| Online Access: | https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4510.toc |
Internet
https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4510.tocRemote Storage
| Call Number: |
QC791.775.P44 C43 2001 |
|
|---|---|---|
| Call Number | Status | Get It |
| QC791.775.P44 C43 2001 | Available | |