Society of Photo-optical Instrumentation Engineers, Delage, O., Munro, E., & Rouse, J. A. (2001). Charged particle detection, diagnostics, and imaging: 30 July-2 August 2001, San Diego, USA. SPIE.
Chicago Style (17th ed.) CitationSociety of Photo-optical Instrumentation Engineers, Olivier Delage, Eric Munro, and John A. Rouse. Charged Particle Detection, Diagnostics, and Imaging: 30 July-2 August 2001, San Diego, USA. Bellingham, Washington: SPIE, 2001.
MLA (9th ed.) CitationSociety of Photo-optical Instrumentation Engineers, et al. Charged Particle Detection, Diagnostics, and Imaging: 30 July-2 August 2001, San Diego, USA. SPIE, 2001.
Warning: These citations may not always be 100% accurate.