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Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA /

Bibliographic Details
Corporate Author: Society of Photo-optical Instrumentation Engineers
Other Authors: Bonse, U.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2002]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4503.
Subjects:
Tomography > Congresses.
X-rays > Congresses.
Diagnostic imaging > Congresses.

Remote Storage

Holdings details from Remote Storage
Call Number: RC78.7.T6 D38 2002
 
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RC78.7.T6 D38 2002 Available