Advances in resist technology and processing XVIII : 26-28 February 2001, Santa Clara, USA /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Semiconductor Equipment and Materials International, International SEMATECH
Other Authors: Houlihan, Francis M.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2001]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4345.
Subjects:

MARC

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245 0 0 |a Advances in resist technology and processing XVIII :  |b 26-28 February 2001, Santa Clara, USA /  |c Francis M. Houlihan, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International, International SEMATECH. 
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