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Improved analysis of DNA short tandem repeats with time-of-flight mass spectrometry /

Bibliographic Details
Main Author: Butler, John M. (John Marshall), 1969-
Corporate Author: National Institute of Justice (U.S.)
Other Authors: Becker, Christopher H.
Format: Government Document Book
Language:English
Published: Washington, DC : U.S. Dept. of Justice, Office of Justice Programs, National Institute of Justice, [2001]
Series:Science and technology research report.
Subjects:
DNA probes > Technological innovations > United States.
DNA fingerprinting > United States > Analysis.
Forensic genetics > Technique > Technological innovations > United States.
Time-of-flight mass spectrometry > United States.
Online Access:Adobe Acrobat Reader required
Description
Item Description:Shipping list number: 2002-0046-P.
"October 2001."
Shipping List Date: 11/27/2001
Physical Description:ix, 75 pages : illustrations (some color) ; 23 cm.
Also available via Internet from the USDOJ/NIJ web site. Address as of 6/17/02: http://www.ncjrs.org/pdffiles1/nij/188292.pdf; current access is available via PURL.
Bibliography:Includes bibliographical references (pages 73-74).
"Grant number 97-LB-VX-0003"--Title page verso.