Improved analysis of DNA short tandem repeats with time-of-flight mass spectrometry /

Bibliographic Details
Main Author:	Butler, John M. (John Marshall), 1969-
Corporate Author:	National Institute of Justice (U.S.)
Other Authors:	Becker, Christopher H.
Format:	Government Document Book
Language:	English
Published:	Washington, DC : U.S. Dept. of Justice, Office of Justice Programs, National Institute of Justice, [2001]
Series:	Science and technology research report.
Subjects:	DNA probes > Technological innovations > United States. DNA fingerprinting > United States > Analysis. Forensic genetics > Technique > Technological innovations > United States. Time-of-flight mass spectrometry > United States.
Online Access:	Adobe Acrobat Reader required

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