Pattern recognition : 23rd DAGM Symposium, Munich, Germany, September 12-14, 2001 : proceedings /

Bibliographic Details
Corporate Author: DAGM (Organization). Symposium
Other Authors: Radig, Bernd, Florczyk, Stefan
Format: Book
Language:English
Published: Berlin ; New York : Springer, [2001]
Series:Lecture notes in computer science ; 2191.
Subjects:
Description
Physical Description:xv, 452 pages : illustrations ; 24 cm.
Bibliography:Includes bibliographical references and index.
ISBN:3540425969 (softcover : alk. paper)