Pattern recognition : 23rd DAGM Symposium, Munich, Germany, September 12-14, 2001 : proceedings /

Bibliographic Details
Corporate Author:	DAGM (Organization). Symposium
Other Authors:	Radig, Bernd, Florczyk, Stefan
Format:	Book
Language:	English
Published:	Berlin ; New York : Springer, [2001]
Series:	Lecture notes in computer science ; 2191.
Subjects:	Optical pattern recognition > Congresses. Image processing > Digital techniques > Congresses.

Remote Storage