X-ray micro- and nano-focusing : applications and techniques II : 30 July 2001, San Diego, USA /
| Corporate Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Washington :
SPIE,
[2001]
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 4499. |
| Subjects: |
Remote Storage
| Call Number: |
TA1775 .X755 2001 |
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|---|---|---|
| Call Number | Status | Get It |
| TA1775 .X755 2001 | Available | |