Transition-fault test generation /

After an integrated circuit is manufactured, it must be tested to insure that it is not defective. Specifically, timing defects are becoming increasingly important to detect because of the decreasing process geometries and increasing clock rates. One way to detect these timing defects is to apply...

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Bibliographic Details

Main Author:	Cobb, Bradley Douglas
Format:	Thesis Book
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 2001.
Subjects:	Major engineering.
Online Access:	Link to OAK Trust copy