Flat panel display technology and display metrology II : 22-23 January 2001, San Jose, USA /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, IS & T--the Society for Imaging Science and Technology
Other Authors: Kelley, Edward F., Voutsas, Tolis
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2001]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4295.
Subjects:
Description
Physical Description:ix, 290 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819439738