Flat panel display technology and display metrology II : 22-23 January 2001, San Jose, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, IS & T--the Society for Imaging Science and Technology
Other Authors:	Kelley, Edward F., Voutsas, Tolis
Format:	Book
Language:	English
Published:	Bellingham, Washington : SPIE, [2001]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4295.
Subjects:	Information display systems > Congresses. Optical measurements > Congresses.

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