A physical approach to metal insulator metal (MIM) tuning capacitor modeling /

Due to the extensive use of capacitors both as tuning and RF bypass elements in monolithic integrated circuit (MMIC) design, it becomes increasingly important to accurately predict the performance of such structures in terms of their losses and behavior as lumped elements. Many attempts have been p...

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Bibliographic Details

Main Author:	Nelson, James Erich, 1973-
Format:	Thesis eBook
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 2000.
Subjects:	Major electrical engineering.
Online Access:	Link to OAKTrust copy