Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA /
| Corporate Author: | |
|---|---|
| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
[2000]
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering ;
v. 4146. |
| Subjects: |
| Physical Description: | vii, 178 pages : illustrations ; 28 cm. |
|---|---|
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 0819437913 |