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Machine vision applications in industrial inspection IX : 22-23 January 2001, San Jose, USA /

Bibliographic Details
Corporate Authors: IS & T--the Society for Imaging Science and Technology, Society of Photo-optical Instrumentation Engineers
Other Authors: Hunt, Martin A.
Format: Book
Language:English
Published: Bellingham, Washington : SPIE, [2001]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4301.
Subjects:
Engineering inspection > Automation > Congresses.
Computer vision > Industrial applications > Congresses.
Quality control > Optical methods > Automation > Congresses.
Measurement > Congresses.

Remote Storage

Holdings details from Remote Storage
Call Number: TS156.2 .M32 2001
 
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TS156.2 .M32 2001 Available