Cover Image

Polarization analysis, measurement, and remote sensing III : 2-4 August 2000, San Diego, USA /

Bibliographic Details
Corporate Authors: Society of Photo-optical Instrumentation Engineers, Remote Sensing Society
Other Authors: Chenault, David B.
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [2000]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4133.
Subjects:
Polarimetry > Congresses.
Remote sensing > Congresses.
Electrooptics > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4133.toc
Description
Item Description:Previous conferences entitled: Polarization analysis and measurement.
Physical Description:ix, 302 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819437786