Polarization analysis, measurement, and remote sensing III : 2-4 August 2000, San Diego, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Remote Sensing Society
Other Authors:	Chenault, David B.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [2000]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4133.
Subjects:	Polarimetry > Congresses. Remote sensing > Congresses. Electrooptics > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4133.toc

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