Process control and inspection for industry : 8-10 November 2000, Beijing, China /

Bibliographic Details
Corporate Authors:	China Optics & Optoelectronic Manufacturers Association, Zhongguo wu li xue hui, Society of Photo-optical Instrumentation Engineers
Other Authors:	Zhang, Shulian, Gao, Wei, Ph. D.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [2000]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4222.
Subjects:	Process control > Automation > Congresses. Manufacturing processes > Automation > Congresses. Detectors > Industrial applications > Congresses.

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