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Optical measurement and nondestructive testing : techniques and applications : 8-10 November 2000, Beijing, China /

Bibliographic Details
Corporate Authors: China Optics & Optoelectronic Manufacturers Association, Zhongguo wu li xue hui, Society of Photo-optical Instrumentation Engineers
Other Authors: Song, Feijun
Format: Book
Language:English
Published: Bellingham, Wash., USA : SPIE, [2000]
Series:Proceedings of SPIE--the International Society for Optical Engineering ; v. 4221.
Subjects:
Optical measurements > Congresses.
Optoelectronic devices > Industrial applications > Congresses.
Nondestructive testing > Congresses.
Online Access:https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4221.toc
Description
Physical Description:xxii, 468 pages : illustrations ; 28 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0819438928