Optical measurement and nondestructive testing : techniques and applications : 8-10 November 2000, Beijing, China /

Bibliographic Details
Corporate Authors:	China Optics & Optoelectronic Manufacturers Association, Zhongguo wu li xue hui, Society of Photo-optical Instrumentation Engineers
Other Authors:	Song, Feijun
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [2000]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4221.
Subjects:	Optical measurements > Congresses. Optoelectronic devices > Industrial applications > Congresses. Nondestructive testing > Congresses.
Online Access:	https://www.spiedigitallibrary.org/conference-proceedings-of-SPIE/4221.toc

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