Process imaging for automatic control : 5-6 November 2000, Boston, USA /

Bibliographic Details
Corporate Authors:	Society of Photo-optical Instrumentation Engineers, Virtual Centre for Industrial Process Tomography
Other Authors:	McCann, Hugh, Scott, David M.
Format:	Book
Language:	English
Published:	Bellingham, Wash., USA : SPIE, [2001]
Series:	Proceedings of SPIE--the International Society for Optical Engineering ; v. 4188.
Subjects:	Radiography, Industrial > Congresses. Tomography > Industrial applications > Congresses.

Remote Storage