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Transmission electron microscopy and diffractometry of materials /

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Bibliographic Details
Main Author: Fultz, B. (Brent)
Other Authors: Howe, James M., 1955-
Format: Book
Language:English
Published: Berlin ; New York : Springer, [2001]
Subjects:
Materials > Microscopy.
Transmission electron microscopy.
X-ray diffractometer.

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Call Number: TA417.23 .F85 2001
 
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TA417.23 .F85 2001 Available