Test point selection using wavelet transforms for mixed-signal circuit /

With growing complexity of today's ICs, it is desirable to improve traditional testing methods to increase the throughput. If one can select a limited number of points to test the circuit from a given test pattern, the time required for testing can be greatly reduced. A test point selection met...

Full description

Bibliographic Details

Main Author:	Huang, Hsing-Chiang
Format:	Thesis eBook
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 2000.
Subjects:	Major electrical engineering.
Online Access:	Link to OAKTrust copy