Semiconductor device and failue analysis : using photon emission microscopy /

Bibliographic Details
Main Author:	Chim, Wai Kin
Format:	Book
Language:	English
Published:	Chichester, [England] ; New York : John Wiley, 2000.
Subjects:	Semiconductors > Failures. Semiconductors > Testing. Semiconductors > Microscopy. Photon emission.

Description
Physical Description:	xv, 269 pages : illustrations ; 24 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	047149240X