Semiconductor device and failue analysis : using photon emission microscopy /

Bibliographic Details
Main Author:	Chim, Wai Kin
Format:	Book
Language:	English
Published:	Chichester, [England] ; New York : John Wiley, 2000.
Subjects:	Semiconductors > Failures. Semiconductors > Testing. Semiconductors > Microscopy. Photon emission.

Remote Storage