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Defects in SiO₂ and related dielectrics : science and technology /

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Bibliographic Details
Corporate Authors: North Atlantic Treaty Organization. Scientific Affairs Division, NATO Advanced Study Institute on Defects in SiO₂ and Related Dielectrics: Science and Technology
Other Authors: Pacchioni, G. (Gianfranco), 1954-, Skuja, L. (Linards), Griscom, David L.
Format: Conference Proceeding Book
Language:English
Published: Dordrecht ; Boston : Kluwer Academic Publishers, [2000]
Series:NATO science series. Mathematics, physics, and chemistry ; v. 2.
Subjects:
Silica > Electric properties > Congresses.
Crystals > Defects > Congresses.
Description
Item Description:"Published in cooperation with NATO Scientific Affairs Division."
"Proceedings of the NATO Advanced Study Institute on Defects in SiO₂ and Related Dielectrics: Science and Technology, Erice, Italy, April 8-20, 2000"--Title page verso.
Physical Description:viii, 624 pages : illustrations ; 25 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0792366859 (acid-free paper)