Defects in SiO₂ and related dielectrics : science and technology /

Bibliographic Details
Corporate Authors:	North Atlantic Treaty Organization. Scientific Affairs Division, NATO Advanced Study Institute on Defects in SiO₂ and Related Dielectrics: Science and Technology
Other Authors:	Pacchioni, G. (Gianfranco), 1954-, Skuja, L. (Linards), Griscom, David L.
Format:	Conference Proceeding Book
Language:	English
Published:	Dordrecht ; Boston : Kluwer Academic Publishers, [2000]
Series:	NATO science series. Mathematics, physics, and chemistry ; v. 2.
Subjects:	Silica > Electric properties > Congresses. Crystals > Defects > Congresses.

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