North Atlantic Treaty Organization. Scientific Affairs Division, NATO Advanced Study Institute on Defects in SiO₂ and Related Dielectrics: Science and Technology, Pacchioni, G., Skuja, L., & Griscom, D. L. (2000). Defects in SiO₂ and related dielectrics: Science and technology. Kluwer Academic Publishers.
Chicago Style (17th ed.) CitationNorth Atlantic Treaty Organization. Scientific Affairs Division, NATO Advanced Study Institute on Defects in SiO₂ and Related Dielectrics: Science and Technology, G. Pacchioni, L. Skuja, and David L. Griscom. Defects in SiO₂ and Related Dielectrics: Science and Technology. Dordrecht ; Boston: Kluwer Academic Publishers, 2000.
MLA (9th ed.) CitationNorth Atlantic Treaty Organization. Scientific Affairs Division, et al. Defects in SiO₂ and Related Dielectrics: Science and Technology. Kluwer Academic Publishers, 2000.