Benefiting from thermal and mechanical simulation in micro-electronics /

Bibliographic Details
Corporate Author: EuroSimE 2000 Eindhoven, Netherlands
Other Authors: Ernst, L. J., Zhang, G. Q., Saint Leger, O. de
Format: Conference Proceeding Book
Language:English
Published: Boston : Kluwer Academic Publishers, [2000]
Subjects:

Remote Storage

Holdings details from Remote Storage
Call Number: TK7874 .E976 2000
 
Call Number Status Get It
TK7874 .E976 2000 Available