X-ray tomography in material science /

Bibliographic Details
Corporate Author:	Workshop on the Application of X-Ray Tomography in Material Science
Other Authors:	Baruchel, José
Format:	Conference Proceeding Book
Language:	English
Published:	Paris : Hermes Science, 2000.
Subjects:	Radiography, Industrial > Congresses. Materials > Testing > Congresses. X-rays > Industrial applications > Congresses. Tomography > Congresses.

Description
Item Description:	"This book collects the texts of the lectures given during the Workshop on the application of X-Ray tomography in material science, which was organised by the Groupe d'Etudes de Métallurgie Physique et de Physique des Matériaux (GEMPPM) in Villeurbanne on October 28-29, 1999."--Foreword.
Physical Description:	204 pages : illustrations ; 24 cm.
Bibliography:	Includes bibliographical references and index of authors; index located at front.
ISBN:	2746201151