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X-ray tomography in material science /

Bibliographic Details
Corporate Author: Workshop on the Application of X-Ray Tomography in Material Science
Other Authors: Baruchel, José
Format: Conference Proceeding Book
Language:English
Published: Paris : Hermes Science, 2000.
Subjects:
Radiography, Industrial > Congresses.
Materials > Testing > Congresses.
X-rays > Industrial applications > Congresses.
Tomography > Congresses.

Evans: Library Stacks

Holdings details from Evans: Library Stacks
Call Number: TA417.25 .X63 2000
 
Call Number Status Get It
TA417.25 .X63 2000 Available