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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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Bibliographic Details
Main Author: Bushnell, Michael L. (Michael Lee), 1950-
Other Authors: Agrawal, Vishwani D., 1943-
Format: Book
Language:English
Published: Boston : Kluwer Academic, [2000]
Series:Frontiers in electronic testing ; 17.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Digital integrated circuits > Testing.
Mixed signal circuits > Testing.
Semiconductor storage devices > Testing.
Description
Physical Description:xviii, 690 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographical references (pages [631]-670) and index.
ISBN:0792379918 (alk. paper)